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Line Profile Analysis is a powerful software tool for extraction of information on the microstructure of polycrystalline materials from X-ray diffraction data. It provides the means to separate line-broadening originating from crystallite size or micro-strain in the sample as well as from instrumental effects. Knowledge of these parameters is a requirement in understanding physical and chemical properties of all kinds of materials, like metals, ceramics, pigments and pharmaceuticals.
Three methods available
Line Profile Analysis contains three different methods for the calculation of lattice strain and crystallite size:
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Approximate method
The Approximate method is based on measurement of the peak height, full width at half maximum (FWHM) and integral breadth of the sample and reference profiles. The resultant parameters are employed in the Scherrer and strain formulae to determine the average crystallite size and the lattice strain.
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Single Line method
The Single Line method calculates the Fourier coefficients of the sample and the reference profiles. Subsequent deconvolution separates the broadened profile from the structural profile, from which the size and strain values can be obtained.
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Warren-Averbach method
The Warren-Averbach method uses Fourier analysis on profiles of low and high angle peaks in order to take the angular dependence of profile broadening into account, giving the most accurate results.
Current version: 1.0
