X'Pert Data Collector gives users of PANalytical's X'Pert XRD systems a powerful central control module for all their XRD measuring routines. Running under Windows XP or Windows 2000, the module delivers easy set-up and configuring of XRD systems in combination with data collection functionality, even in 21 CFR Part 11 regulated environments.
The package also includes:
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X'Pert Automatic Processing Program, allowing multiple tasks to run unattended
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X'Pert Explorer Add-ons to facilitate automatic analysis, data handling and reporting
The open XRDML data platform simplifies data sharing.
Complete system validation before routine starts
X'Pert Data Collector holds an inventory of all the optical components, instrument types and settings in the current configuration. Before a measurement routine is started, a complete system validation helps prevent unachievable or potentially hazardous actions. System default settings enable novice users to start measuring straight away. Experienced users can develop optimum measurement strategies, including complex routines for special applications.
Wide variety of scan types
Besides basic θ-2θ operation, scans can be made using axes including 2θ only, ω (angle of incidence), ω-2θ with/without offset between ω and θ, ψ (tilt axis), φ (rotation about the normal to sample surface), x (sample translation), y (sample translation), and z (sample height). More complex results include stress, sample texture, Q-scans (straight lines in reciprocal space), and sample and reciprocal space mapping
Current version: 2.2h



