Language:
Quantitative phase analysis software for X-ray diffraction applications
X'Pert Quantify delivers complete, automated quantitative phase analysis including measurement, extraction and correction routines. Using all currently accepted analytical models, X'Pert Quantify incorporates as many as 10 calibration models and a wealth of intensity-correction methods.
Capable of working independently or with other X'Pert Software like X'Pert Data Collector, X'Pert Quantify accepts peak-intensity measurements and integrated-area measurements. It saves scans in PANalytical's open XRDML data format, and stores quantitative results in an Microsoft Access database.
Measurement and analysis are independent of each other, so X'Pert Quantify can also evaluate data off-line, allowing users to extract and/or analyze relevant intensities from previously-acquired measurements.
Wide range of quantification models with advanced intensity correction
X'Pert Quantify offers the most complete range of quantification models including General, Straight-Line, Matrix Flushing, Internal Standard, Single- and Dual-line Addition, Relative Intensity Ratio, and Thin layer models. All of these models are based on a direct measurement of the individual reflections rather than the interpretation of a complete scan.
State-of-the-art
X'Pert Quantify controls all PANalytical X-ray diffraction systems from 1989 onwards, including legacy models. For these, the software brings an important upgrade to state-of-the-art.
Current version: 1.1
