X'Pert Stress

Measuring residual stress

PANalytical's X'Pert Stress software is dedicated to X-ray diffraction (XRD) analysis of residual stress. Values are calculated according to the well-known single-{hkl} sin²ψ method. User-configurable defaults and instant recalculation of results based on a change of input parameters, makes X'Pert Stress ideal for both routine analysis and research applications.

Techniques and measurement

The software performs sin²ψ residual stress analysis using both classical uni-directional and multi-directional (full stress tensor) techniques. Both X-stress and ω-stress measurement techniques are incorporated. X'Pert Stress calculates all intermediate results and final stress data instantly. The influence of all parameters is directly reflected in the final result.

Comprehensive methodology

Uniquely, X'Pert Stress incorporates all established methods for peak position determination, including:

center of gravity
centered center of gravity
parabola fit
profile shape functions

Measured scans can be corrected for:

automatic divergence slit
background
Lorentz-Polarization factor
X-ray absorption
K alpha₂ wavelength

Additionally, multiple peak fitting corrects for overlapping peaks.

Elastic constants database

A dedicated X-ray elastic constants (XEC) database contains more than 400 verified entries and a built-in XEC calculator. Data retrieval is possible for isotropic elastic constants, X-ray elastic constants and single-crystal elastic constants.

Reliable results

Minor misalignments are analyzed based on measurements on a stress-free sample. Reliable results are ensured by applying corresponding corrections in the analysis of unknown samples.

Multiple measurement files

X'Pert Stress offers complete experimental freedom and the option to analyze combined data from different data files. Additional data can be added at any time.

Key features

Key features of X'Pert Stress software are: