X'Pert Reflectivity

X'Pert Reflectivity provides a powerful tool for analyzing X-ray reflectometry data. By allowing automatic fitting of simulated to experimental specular X-ray reflectivity curves, X'Pert Reflectivity makes reflectometry, formerly the preserve of highly professional users, available to routine users. 

X'Pert Reflectivity is part of PANalytical's X'Pert Software range and uses the XRDML data format.

Automatic fitting

X'Pert Reflectivity's automatic fitting procedure performs multiple simulations to refine selected sample and instrument parameters to obtain the best fit with the measured data. Users can select one of three different automatic fitting procedures:

• Segmented fitting – similar to the automatic fitting procedure in X'Pert Epitaxy and Smoothfit.
• Genetic algorithm fitting – introduces automatically random modifications of selected parameters, which are tested for a best fit.
• Combined genetic alogorithm and segmented fitting – generates a first approximation using the genetic algorithm and then automatically refines this with segmented fitting.

All three settings give you all the options to start analyzing your reflectivity data immediately with X'Pert Reflectivity. The software can be launched and controlled by X'Pert APP (Automatic Processing Program), fully satisfying user needs.

Materials database

An extensive materials database is included for use in simulation and fitting. It contains materials data, such as elemental atomic numbers and masses, as well as their mass absorption and anomalous dispersion coefficients for different X-ray wavelengths. The database can be extended with new materials and values for other wavelengths.