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ProFit enables simultaneous deconvolution of overlapped peaks in complete XRD patterns, making the whole process fast and easy. Taking data from X'Pert Data Collector, the package calculates peak characteristics, such as position, intensity, width and shape of each individual reflection.
Operation can be fully automated, or the fitting process can be controlled using an interactive graphical interface with extensive on-line help.
Works with severely overlapping patterns
ProFit extracts accurate information from even severely overlapped patterns. The program calculates peak profile characteristics by refining the measured data with user-selected mathematical functions. It defines the position, intensity, width (FWHM) and shape for up to 200 individual reflections, with a maximum of 9000 data points.
Specifically developed for diffractionists, this powerful module works in a wide range of applications including crystallite size and micro-strain evaluation, indexing of powder patterns, unit-cell measurement, and structure determination.
Current version: 1.0c
