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Structural analysis for materials research and crystallography
X-ray powder diffractometry (XRPD) is a valuable tool for the research and development of advanced materials. It can be used for investigation of the following properties:
- The identification of the phase(s) present: is it a pure phase or does the material contain impurities as a result of the production process?
- The quantification of mixtures of phases
- The degree of crystallinity of the phase(s)
- The crystallographic structure of the material: space group determination and indexing, structure refinement and ultimately structure solving
- The degree of orientation of the crystallites: texture analysis.
- The deformation of the crystallites as a result of the production process: residual stress analysis
- The influence of non-ambient conditions on these properties
All these investigations can be carried out on samples of varying dimensions:
- Powders, from bulk samples to very small amounts
- Solid materials of varying shapes and size, such as machined metallic or ceramic components or pills
- Well plates for combinatorial analysis
PANalytical solutions
PANalytical's X'Pert PRO system can be easily configured for all these tasks. And, when equipped with PANalytical's revolutionary PreFIX instrument, X'Pert PRO can switch between these tasks in minutes.
