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A novel application in X-ray diffraction
PANalytical's X'Pert Stress Plus software is dedicated to the X-ray diffraction (XRD) analysis of residual stress in polycrystalline coatings. The software performs sin²ψ residual stress analysis using both uni-directional and multi-directional techniques.
Grazing incidence XRD data
X'Pert Stress Plus supports grazing incidence XRD data on single or multiple-{hkl} peaks, and allows measurements to be combined with X-tilting. A conversion algorithm calculates true ψ-tilts for all possible combinations of instrument angles.
Multiple-{hkl} sin²ψ analysis
Data from different {hkl} peaks can be analyzed together in one sin²ψ measurement. X'Pert Stress Plus automatically accounts for peak shifts due to stress, assigning correct indices and identifying coating and substrate or sub-layer peaks.
Interactive calculations and complete, automatic analysis
X'Pert Stress Plus calculates all intermediate results and final stress data instantly. The influence of all paramaters is directly reflected in the final result.
User-configurable defaults and instant recalculation of results based on a change of input parameters, makes X'Pert Stress Plus ideal for both routine analysis and research applications.
Comprehensive methodology
Uniquely, X'Pert Stress Plus incorporates all established methods for peak position determination, including:
- center of gravity
- centered center of gravity
- parabola fit
- profile shape functions
X'Pert Stress Plus can correct measured scans for:
- automatic divergence slit
- background
- Lorentz-Polarization factor
- X-ray absorption
- K alpha2 wavelength
Moreover, multiple peak fitting corrects for overlapping peaks.
Multiple measurement files
The option to analyze combined data sets from multiple data files provides complete experimental freedom. Additional data can be added at any time.
Key features
Key features of X'Pert Stress Plus software are:
- Software for analysis of residual stress in polycrystalline coatings
- Support of grazing incidence XRD data
- Analysis on combined datasets from multiple measurement files
- Interactive calculations and complete, automatic analysis
- Wide choice of pattern treatment and peak position methods
- Multiple-{hkl} sin²ψ stress analysis
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